Projects funded by the NCN

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Information of the project and the call

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Nanometrology of Nottingham cooling effect using operational micro-electromechanical systems

2020/37/B/ST7/03792

Keywords:

Nanometrology nanoelectronics micro-and nanoelectromechanical systems MEMS NEMS

Descriptors:

  • ST7_4: Micro- and nanosystems engineering

Panel:

ST7 - Systems and communication engineering: electronics, communication, optoelectronics

Host institution :

Politechnika Wrocławska

woj.

Other projects carried out by the institution 

Principal investigator (from the host institution):

prof. Teodor Paweł Gotszalk 

Number of co-investigators in the project: 7

Call: OPUS 19 - announced on 2020-03-16

Amount awarded: 1 523 640 PLN

Project start date (Y-m-d): 2021-01-19

Project end date (Y-m-d): 2024-05-18

Project duration:: 40 months (the same as in the proposal)

Project status: Project settled

Project description

Download the project description in a pdf file

Note - project descriptions were prepared by the authors of the applications themselves and placed in the system in an unchanged form.

Information in the final report

  • Publication in academic press/journals (20)
  1. Electrical, thermal and noise properties of platinum-carbon free-standing nanowires designed as nanoscale resistive thermal devices
    Authors:
    Tomasz Piasecki , Krzysztof Kwoka , Ewelina Gacka , Piotr Kunicki, Teodor Gotszalk
    Academic press:
    Nanotechnology (rok: 2023, tom: 35, strony: 115502), Wydawca: IOP
    Status:
    Published
    DOI:
    10.1088/1361-6528/ad13c0 - link to the publication
  2. Corrigendum to Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy".
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow c, Krzysztof Kwoka a
    Academic press:
    Measurement (rok: 2022, tom: 191, strony: 110828), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2022.110828 - link to the publication
  3. Ion microsource integrated with scanning electron microscope for sample preparation
    Authors:
    Witold Slówko, Teodor Gotszalk
    Academic press:
    Micron (rok: 2023, tom: 167, strony: 103419), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.micron.2023.103419 - link to the publication
  4. Integration of Fluorescent, NV-Rich Nanodiamond Particles with AFM Cantilevers by Focused Ion Beam for Hybrid Optical and Micromechanical Devices
    Authors:
    Mateusz Ficek, Maciej J. Głowacki, Krzysztof Gajewski, Piotr Kunicki, Ewelina Gacka, Krystian Sycz, Mariusz Mrózek, Adam M. Wojciechowski, Teodor P. Gotszalk, Wojciech Gawlik, Robert Bogdanowicz
    Academic press:
    Coatings (rok: 2021, tom: 11, strony: 1332), Wydawca: MDPI
    Status:
    Published
    DOI:
    10.3390/coatings11111332 - link to the publication
  5. Metrology and control of electromagnetically actuated cantilevers using optical beam deflection method
    Authors:
    Daniel Kopiec, Wojciech Majstrzyk, Bartosz Pruchnik, Ewelina Gacka, Dominik Badura, Andrzej Sierakowski, Paweł Janus, TeodorGotszalk
    Academic press:
    METROLOGY AND MEASUREMENT SYSTEMS (rok: 2021, tom: 28, strony: 627-642), Wydawca: Polish Academy of Sciences
    Status:
    Published
    DOI:
    10.24425/mms.2021.137698 - link to the publication
  6. Study of the Efficiency of Microcantilevers: Cases of Electrothermal and Electromagnetic Actuation
    Authors:
    Bartosz Pruchnik, Tomasz Piasecki, Karolina Orlowska, Wojciech Majstrzyk, Andrzej Sierakowski, Teodor Gotszalk, Ivo Rangelow
    Academic press:
    Journal of Microelectromechanical Systems (rok: 2022, tom: 31, strony: 784 - 790), Wydawca: IEEE
    Status:
    Published
    DOI:
    10.1109/JMEMS.2022.3187793 - link to the publication
  7. Wavelet-Based Information Theory in Quantitative Assessment of AFM Images' Quality
    Authors:
    Bartosz Pruchnik, Piotr Putek, Teodor Gotszalk
    Academic press:
    Scientific Reports (rok: 2024, tom: 14, strony: 3996), Wydawca: Springer
    Status:
    Published
    DOI:
    10.1038/s41598-024-53846-y - link to the publication
  8. Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
    Academic press:
    Measurement (rok: 2022, tom: 188, strony: 110373), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2021.110373 - link to the publication
  9. Ion microsource integrated with scanning electron microscope for sample preparation
    Authors:
    Witold Slówko, Teodor Gotszalk
    Academic press:
    Micron (rok: 2023, tom: 167, strony: 103419), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.micron.2023.103419 - link to the publication
  10. Corrigendum to Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy".
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow c, Krzysztof Kwoka a
    Academic press:
    Measurement (rok: 2022, tom: 191, strony: 110828), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2022.110828 - link to the publication
  11. Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
    Academic press:
    Measurement (rok: 2022, tom: 188, strony: 110373), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2021.110373 - link to the publication
  12. Measurement 188 (2022) 110373 Available online 1 November 2021 0263-2241/© 2021 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
    Academic press:
    Measurement (rok: 2022, tom: 188, strony: 110373), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2021.11037 - link to the publication
  13. Electrical, thermal and noise properties of platinum-carbon free-standing nanowires designed as nanoscale resistive thermal devices
    Authors:
    Tomasz Piasecki , Krzysztof Kwoka , Ewelina Gacka , Piotr Kunicki, Teodor Gotszalk
    Academic press:
    Nanotechnology (rok: 2023, tom: 35, strony: 115502), Wydawca: IOP
    Status:
    Published
    DOI:
    10.1088/1361-6528/ad13c0 - link to the publication
  14. Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy
    Authors:
    Ewelina Gacka, Bartosz Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo W. Rangelow, Teodor Gotszalk
    Academic press:
    Measurement (rok: 2024, tom: 234, strony: 114815), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2024.114815 - link to the publication
  15. Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopy
    Authors:
    Ewelina Gacka, Piotr Kunicki, Paulina Łysik, Krzysztof Gajewski, Paulina Ciechanowicz, Damian Pucicki , Dominika Majchrzak, Teodor Gotszalk , Tomasz Piasecki, Tito Busani, Ivo W. Rangelow, Detlef Hommel
    Academic press:
    Ultramicroscopy (rok: 2023, tom: 248, strony: 113713), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.ultramic.2023.113713 - link to the publication
  16. Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
    Academic press:
    Measurement (rok: 2022, tom: 188, strony: 110373), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2021.110373 - link to the publication
  17. Impedance spectroscopy of electrostatically driven MEMS resonators
    Authors:
    Krzysztof Kwoka, Tomasz Piasecki, Karolina Orłowska, Paulina Grabarczyk, Andrzej Sierakowski, Teodor Gotszalk, Ewelina Gacka, Adrianna Piejko, Krzysztof Gajewski
    Academic press:
    Measurement (rok: 2023, tom: 215, strony: 112845), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2023.112845 - link to the publication
  18. Improvement of MEMS Thermomechanical Actuation Efficiency by Focused Ion Beam-Induced Deposition
    Authors:
    Bartosz Pruchnik, Tomasz Piasecki, Ewelina Gacka, Mateus G. Masteghin, David C. Cox, Teodor Gotszalk
    Academic press:
    Journal of Microelectromechanical Systems (rok: 2024, tom: 33, strony: 362 - 368), Wydawca: IEEE
    Status:
    Published
    DOI:
    10.1109/JMEMS.2024.3377595 - link to the publication
  19. Corrigendum to Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy".
    Authors:
    Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow c, Krzysztof Kwoka a
    Academic press:
    Measurement (rok: 2022, tom: 191, strony: 110828), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2022.110828 - link to the publication
  20. Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopy
    Authors:
    Ewelina Gacka, Piotr Kunicki, Paulina Łysik, Krzysztof Gajewski, Paulina Ciechanowicz, Damian Pucicki , Dominika Majchrzak, Teodor Gotszalk , Tomasz Piasecki, Tito Busani, Ivo W. Rangelow, Detlef Hommel
    Academic press:
    Ultramicroscopy (rok: 2023, tom: 248, strony: 113713), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.ultramic.2023.113713 - link to the publication

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