Projects funded by the NCN

Information on the principal investigator and host institution

Information of the project and the call

Keywords

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Modelling of thermal phenomena in electronic nanosystems.

2016/21/B/ST7/02247

Keywords:

electronic nanosystems thermal modelling

Descriptors:

  • ST7_5: Micro- and nanelectronic, optoelectronic and photonic components
  • ST7_3: Simulation engineering and modelling
  • ST7_2: Electrical engineering: power components and/or systems

Panel:

ST7 - Systems and communication engineering: electronics, communication, optoelectronics

Host institution :

Politechnika Łódzka, Wydział Elektrotechniki, Elektroniki, Informatyki i Automatyki

woj. łódzkie

Other projects carried out by the institution 

Principal investigator (from the host institution):

prof. Andrzej Napieralski 

Number of co-investigators in the project: 10

Call: OPUS 11 - announced on 2016-03-15

Amount awarded: 827 100 PLN

Project start date (Y-m-d): 2017-04-10

Project end date (Y-m-d): 2021-04-09

Project duration:: 48 months (the same as in the proposal)

Project status: Project settled

Project description

Download the project description in a pdf file

Note - project descriptions were prepared by the authors of the applications themselves and placed in the system in an unchanged form.

Equipment purchased [PL]

  1. Komputer do przeprowadzania symulacji termicznych z wykorzystaniem metody różnic skończonych. (8 000 PLN)
  2. Komputer o dużej mocy obliczeniowej waraz z oprogramowaniem COMSOL. (14 000 PLN)
  3. Komputer wraz z licencją i oprogramowaniem do symulacji komputerowych Metodą Elementów Skończonych: COMSOL lub SOLIDWORKS (30 000 PLN)
  4. Komputer wraz z licencją i oprogramowaniem do symulacji komputerowych Metodą Elementów Skończonych: FlexPDE.
  5. Komputer wraz z oprogramowaniem Matlab do opracowania algorytmów estymacji parametrów modeli oraz uzyskiwania rozwiązań analitycznych. (12 000 PLN)

Information in the final report

  • Publication in academic press/journals (5)
  • Articles in post-conference publications (9)
  1. Influence of temperature and heat flux time lags on the temperature distribution in modern GAAFET structure based on Dual-Phase-Lag thermal model
    Authors:
    Tomasz Raszkowski, Agnieszka Samson, Mariusz Zubert
    Academic press:
    Microelectronics Reliability (rok: 2018, tom: Volume 86, strony: Pages 10-19), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.microrel.2018.05.004 - link to the publication
  2. Active calibration reference of minimized height for characterization of scanning thermal microscopy systems
    Authors:
    Paweł Janus, Dariusz Szmigiel, Andrzej Sierakowski, Maciej Rudek, Teodor Gotszalk
    Academic press:
    Ultramicroscopy (rok: 2021, tom: 221, strony: 188-191), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.ultramic.2020.113188 - link to the publication
  3. Methodology of determining the applicability range of the DPL model to heat transfer in modern integrated circuits comprised of FinFETs
    Authors:
    Mariusz Zubert, Tomasz Raszkowski, Agnieszka Samson, Piotr Zając
    Academic press:
    Microelectronics Reliability (rok: 2018, tom: Volume 91, strony: Pages 139-153), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.microrel.2018.07.141 - link to the publication
  4. Analysis of Algorithm Efficiency for Heat Diffusion at Nanoscale Based on a MEMS Structure Investigation
    Authors:
    Raszkowski Tomasz,Zubert Mariusz
    Academic press:
    Energies (rok: 2020, tom: 13, strony: 15), Wydawca: MDPI
    Status:
    Published
    DOI:
    10.3390/en13102520 - link to the publication
  5. Investigation of Heat Diffusion at Nanoscale Based on Thermal Analysis of Real Test Structure
    Authors:
    Raszkowski Tomasz,Zubert Mariusz:
    Academic press:
    Energies (rok: 2020, tom: 13, strony: 18), Wydawca: MDPI
    Status:
    Published
    DOI:
    10.3390/en13092379 - link to the publication
  1. Comparison of temperature distributions in modern nanostructures based on different parameters of Dual-Phase-Lag equation
    Authors:
    Tomasz Raszkowski, Agnieszka Samson, Mariusz Zubert, Marcin Janicki
    Conference:
    20th IEEE Electronics Packaging Technology Conference (EPTC) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja 4-7 Dec.
    Status:
    Published
  2. Manufacturing and Characterisation of MEMS Test Nanostructures
    Authors:
    Grzegorz Jabłoński, Paweł Janus, Piotr Pietrzak, Tomasz Torzewicz, Artur Sobczak, Marcin Janicki, Andrzej Napieralski, Andrzej Sierakowski, Anna Brzezińska, Piotr Prokaryn
    Conference:
    23rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) (rok: 2017, ), Wydawca: IEEE
    Data:
    konferencja 27-29 September
    Status:
    Published
  3. Measurement and Modeling of Heat Conduction in MEMS Nanostructures
    Authors:
    Marcin Janicki, Paweł Janus, Piotr Pietrzak, Piotr Zajac, Grzegorz Jablonski, Artur Sobczak, Jedrzej Topiłko, Andrzej Napieralski
    Conference:
    17th InterSociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja May 29 - June 1
    Status:
    Published
  4. Analysis of Heat Transfer Processes in Electronic Nanostructures Using The Dual-Phase-Lag Model
    Authors:
    Marcin Janicki, Artur Sobczak, Grzegorz Jabłoński
    Conference:
    28th International Conference Mixed Design of Integrated Circuits and Systems (MIXDES) (rok: 2021, ), Wydawca: IEEE
    Data:
    konferencja 24-26 June
    Status:
    Published
  5. Manufacturing and Characterization of Test Structures Dedicated for The Investigation of Heat Transfer Processes at Nanoscale
    Authors:
    J. Topiłko, A. Sobczak, P. Pietrzak, P. Zając, M. Janicki, P. Janus, M. Zubert, A. Napieralski
    Conference:
    25th International Workshop on Thermal Investigations of ICs and Systems THERMINIC (rok: 2019, ), Wydawca: IEEE
    Data:
    konferencja 25-27 September
    Status:
    Published
  6. Measurement and Simulation of MEMS Dedicated to Investigation of Heat Transfer at Nanoscale
    Authors:
    Marcin Janicki, Piotr Pietrzak, Jedrzej Topilko, Piotr Zajac, Artur Sobczak, Grzegorz Jablonski, Pawel Janus, Piotr Prokaryn, Andrzej Napieralski
    Conference:
    19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja 15-18 April
    Status:
    Published
  7. Measurement and Simulation of Test Structures Dedicated to the Investigation of Heat Diffusion at Nanoscale,
    Authors:
    M. Janicki, J. Topilko, A. Sobczak, P. Zajac, P. Pietrzak, A. Napieralski
    Conference:
    20th Annual International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems EuroSimE (rok: 2019, ), Wydawca: IEEE
    Data:
    konferencja March 24-27
    Status:
    Published
  8. Assessment of Different Methodologies for The Estimation of DPL Model Parameter Values for Dynamic Thermal Simulations of Nanoscale Electronic Structures
    Authors:
    Marcin Janicki, Mariusz Zubert, Piotr Zajac, Tomasz Raszkowsk, Jedrzej Topilko, Piotr Pietrzak, Grzegorz Jablonski, Agnieszka Samson, Andrzej Napieralski
    Conference:
    24th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja 26-28 September
    Status:
    Published
  9. Determining Parameters of the Dual-Phase-Lag Model of Heat Flow
    Authors:
    Mariusz Zubert, Tomasz Raszkowski, Jędrzej Topiłko, Łukasz Starzak, Grzegorz Jabłoński Paweł Janus, Marcin Janicki, Andrzej Napieralski
    Conference:
    25th International Conference Mixed Design of Integrated Circuits and Systems (MIXDES) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja 21-23 June
    Status:
    Published

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