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1 projects found matching your search criteria :

Secondary Ion Mass Spectrometry characterization of thin films with nanometer and subnanometer depth resolution

Call: SONATA 14 , Panel: ST5

Principal investigator: dr hab. Paweł Michałowski

Sieć Badawcza ŁUKASIEWICZ - Instytut Mikroelektroniki i Fotoniki

O Narodowym Centrum Nauki

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