Projects funded by the NCN

Information on the principal investigator and host institution

Information of the project and the call

Keywords

Equipment

Delete all

Application of computational physics to study the influence of structural defects on the properties of silicon carbide devices

2013/09/B/ST7/04203

Keywords:

SiC ab inito Monte Carlo defects silicon carbide computational physics

Descriptors:

  • ST7_2: Electrical engineering: power components and/or systems
  • ST7_3: Simulation engineering and modelling
  • ST7_5: Micro- and nanelectronic, optoelectronic and photonic components

Panel:

ST7 - Systems and communication engineering: electronics, communication, optoelectronics

Host institution :

Politechnika Łódzka, Wydział Elektrotechniki, Elektroniki, Informatyki i Automatyki

woj. łódzkie

Other projects carried out by the institution 

Principal investigator (from the host institution):

prof. Włodzimierz Nakwaski 

Number of co-investigators in the project: 8

Call: OPUS 5 - announced on 2013-03-15

Amount awarded: 829 318 PLN

Project start date (Y-m-d): 2014-04-24

Project end date (Y-m-d): 2018-04-23

Project duration:: 48 months (the same as in the proposal)

Project status: Project settled

Information in the final report

  • Publication in academic press/journals (3)
  • Articles in post-conference publications (7)
  • Book publications / chapters in book publications (2)
  1. Monte Carlo simulations of electron transport in 4H‑SiC using the DFT‑calculated density of states
    Authors:
    Janusz Wozny, Andrii Kovalchuk, Zbigniew Lisik, Jacek Podgorski, Piotr Bugalski, Andrzej Kubiak, Lukasz Ruta
    Academic press:
    Journal of Computational Electronics (rok: 2021, tom: 20, strony: 791–797), Wydawca: Springer Nature
    Status:
    Published
    DOI:
    10.1007/s10825-021-01658-y - link to the publication
  2. Extended Hückel Semi-Empirical Approach as an Efficient Method for Structural Defects Analysis in 4H-SiC
    Authors:
    Janusz Wozny, Andrii Kovalchuk, Jacek Podgorski and Zbigniew Lisik
    Academic press:
    Materials (rok: 2021, tom: 14, strony: 1247), Wydawca: MDPI AG
    Status:
    Published
    DOI:
    10.3390/ma14051247 - link to the publication
  3. Monte Carlo simulations of hole transport in 4H-SiC using DOS calculations
    Authors:
    Andrii Kovalchuk, Janusz Wozny, Zbigniew Lisik, Jacek Podgorski, Lukasz Ruta, Andrzej Kubiak, Armen Boiadzhian
    Academic press:
    Journal of Physics: Conference Series (rok: 2020, tom: 1534, strony: 45296), Wydawca: IOP Publishing
    Status:
    Published
    DOI:
    10.1088/1742-6596/1534/1/012006 - link to the publication
  1. Effect of Point Defects for 4H-SiC Band Structure by the Means of Ab-Initio Calculation
    Authors:
    Janusz Woźny, Łukasz Ruta, Andrzej Kubiak, Zbigniew Lisik, Jacek Podgórski, Andrii Kovalchuk, Natalia Szczecińska, Piotr Bugalski
    Conference:
    MICROTHERM 2017 (rok: 2017, ), Wydawca: Lodz University of Technology
    Data:
    konferencja 2017-06-27 - 2017-06-29
    Status:
    Published
  2. Investigation on Micropipes and Structural Defects Densities in 4H-SiC Substrates
    Authors:
    Andrzej Kubiak, Anna Paprocka, Maciej Wendler, Łukasz Ruta, Janusz Woźny
    Conference:
    MICROTHERM 2017 (rok: 2017, ), Wydawca: Lodz University of Technology
    Data:
    konferencja 2017-06-27 - 2017-06-29
    Status:
    Published
  3. Ensemble Monte Carlo simulation of 4H-SiC for electrons mobility calculation
    Authors:
    Andrii Kovalchuk; Janusz Wozny, Zbigniew Lisik, Jacek Podgorski, Piotr Bugalski, Mykhaylo Lobur, Petro Kosobutskyy
    Conference:
    XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja 18-22 April 2018
    Status:
    Published
    DOI:
    link to the publication
  4. DFT simulation of stacking faults defects in 4H-SiC
    Authors:
    Janusz Wozny, Andrii Kovalchuk, Zbigniew Lisik, Jacek Podgorski, Piotr Bugalski, Andrzej Kubiak, Lukasz Ruta
    Conference:
    XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) (rok: 2018, ), Wydawca: IEEE
    Data:
    konferencja 18-22 April 2018
    Status:
    Published
    DOI:
    link to the publication
  5. Mobility of Electrons in Doped Bulk 4H-SiC
    Authors:
    A. Kovalchuk, J. Wozny, D. Illiano, A. Kubiak, L. Ruta, J. Podgórski, Z. Lisik
    Conference:
    MICROTHERM 2019 Microtechnology and Thermal Problems in Electronics (rok: 2019, ), Wydawca: Lodz University of Technology
    Data:
    konferencja 24-26 VI 2019
    Status:
    Published
  6. Monte Carlo simulation of hole transport in 4H-SiC using effective parameters
    Authors:
    A. Kovalchuk, J. Woźny, Z. Lisik, J. Podgorski, Ł. Ruta, A. Kubiak, A. Boiadzhian
    Conference:
    MICROTHERM 2019 Microtechnology and Thermal Problems in Electronics (rok: 2019, ), Wydawca: Lodz University of Technology
    Data:
    konferencja 24-26 VI 2019
    Status:
    Published
  7. Monte Carlo Electron Transport Simulation of 4H-SiC using DFT Calculated Density of States
    Authors:
    J. Woźny, A. Kovalchuk, Z. Lisik, J. Podgorski, P. Bugalski, A. Kubiak, Ł. Ruta
    Conference:
    CSC'18 - The 16th Int'l Conf on Scientific Computing (rok: 2018, ), Wydawca: American Council on Science and Education
    Data:
    konferencja Jul 30-Aug 02, 2018
    Status:
    Published
    DOI:
    link to the publication
  1. DFT Simulation of Stacking Faults Defects in 4H-SiC
    Authors:
    Wozny, Janusz and Kovalchuk, Andrii and Lisik, Zbigniew and Podgorski, Jacek and Bugalski, Piotr and Kubiak, Andrzej and Ruta, Lukasz
    Book:
    2018 Xivth International Conference on Perspective Technologies and Methods in Mems Design (Memstech) (rok: 2018, tom: -na-, strony: 65-68), Wydawca: IEEE
    Status:
    Published
  2. Ensemble Monte Carlo Simulation of 4H-SiC for Electrons Mobility Calculation
    Authors:
    Kovalchuk, Andrii and Wozny, Janusz and Lisik, Zbigniew and Podgorski, Jacek and Bugalski, Piotr and Lobur, Mykhaylo and Kosobutskyy, Petro
    Book:
    2018 Xivth International Conference on Perspective Technologies and Methods in Mems Design (Memstech) (rok: 2018, tom: -na-, strony: 73-76), Wydawca: IEEE
    Status:
    Published

O Narodowym Centrum Nauki

Finansowanie nauki

Współpraca zagraniczna

Centrum prasowe

Deklaracja dostępności
Przetwarzanie danych osobowych
Polityka cookies

Partnerzy