Projects funded by the NCN
Argon gas cluster ion beam applied to depth profiling of polymeric materials by X-ray photoelectron spectroscopy
2013/09/B/ST4/02951
Keywords:
gas cluster ion beam polymer X-ray photoelectron spectroscopy organic depth profiling
Descriptors:
- ST4_3: Molecular architecture and structure
- ST5_19:
- ST4_5: Analytical chemistry
Panel:
ST4 - Chemistry: physical chemistry/chemical physics, theoretical chemistry, analytical chemistry, inorganic chemistry, organic chemistry, method development
Host institution :
Akademia Górniczo-Hutnicza im. Stanisława Staszica w Krakowie, Wydział Fizyki i Informatyki Stosowanej
woj. małopolskie
Principal investigator (from the host institution):
Number of co-investigators in the project: 6
Call: OPUS 5 - announced on 2013-03-15
Amount awarded: 559 500 PLN
Project start date (Y-m-d): 2014-02-21
Project end date (Y-m-d): 2016-02-20
Project duration:: 24 months (the same as in the proposal)
Project status: Project settled
Equipment purchased [PL]
- Profilometr (280 000 PLN)
Information in the final report
- Publication in academic press/journals (2)
- XPS depth profiling of organic photodetectors with the gas cluster ion beamAuthors:J. Haberko, M. M. Marzec, A. Bernasik, W. Łużny, P. Lienhard, A. Pereira, J. Faure-Vincentand, D. Djurado, A. RevauxAcademic press:Journal of Vacuum Science & Technology B (rok: 2016, tom: 34, strony: 03H119-1 - 5), Wydawca: American Vacuum SocietyStatus:PublishedDOI:10.1116/1.4943028 - link to the publication
- Chemical stability of polymers under argon gas cluster ion beam and x-ray irradiationAuthors:A. Bernasik, J. Haberko, M. M. Marzec, J. Rysz, W. Łużny, A. BudkowskiAcademic press:Journal of Vacuum Science & Technology B (rok: 2016, tom: 34, strony: 030604-1 - 5), Wydawca: American Vacuum SocietyStatus:PublishedDOI:10.1116/1.4943951 - link to the publication