Projects funded by the NCN


Information on the principal investigator and host institution

Information of the project and the call

Keywords

Equipment

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High-resolution investigation of thermal properties of nanostructures using scanning thermal microscopy with nanotip resistive thermal nanosensors

2011/03/N/ST7/02607

Keywords:

nanometrology nanotechnology scanning probe microscopy

Descriptors:

  • ST7_5: Micro- and nanelectronic, optoelectronic and photonic components
  • ST7_2: Electrical engineering: power components and/or systems

Panel:

ST7 - Systems and communication engineering: electronics, communication, optoelectronics

Host institution :

Politechnika Wrocławska, Wydział Elektroniki Mikrosystemów i Fotoniki

woj. dolnośląskie

Other projects carried out by the institution 

Principal investigator (from the host institution):

Grzegorz Wielgoszewski 

Number of co-investigators in the project: 2

Call: PRELUDIUM 2 - announced on 2011-09-15

Amount awarded: 93 900 PLN

Project start date (Y-m-d): 2012-09-14

Project end date (Y-m-d): 2013-09-13

Project duration:: 12 months (the same as in the proposal)

Project status: Project settled

Equipment purchased [PL]

  1. Wzmacniacz fazoczuły (typu lock-in) - Stanford Research Systems SR830 (24 969 PLN)

Information in the final report

  • Publication in academic press/journals (1)
  • Articles in post-conference publications (1)
  1. Standard-based direct calibration method for scanning thermal microscopy nanoprobes
    Authors:
    Grzegorz Wielgoszewski, Michał Babij, Roman F. Szeloch, Teodor Gotszalk
    Academic press:
    Sensors and Actuators A. Physical (rok: 2014, tom: 214, strony: 1–6), Wydawca: Elsevier Science SA
    Status:
    Published
    DOI:
    10.1016/j.sna.2014.03.035 - link to the publication
  1. Calibration issues in scanning thermal microscopy investigations of thermal properties of micro- and nanostructures
    Authors:
    Grzegorz Wielgoszewski, Grzegorz Jóźwiak, Michał Babij, Teodor Gotszalk, Paweł Janus, Piotr Grabiec, Robert Geer
    Conference:
    Microtherm 2013: Microtechnology and Thermal Problems in Electronics (rok: 2013, ), Wydawca: Politechnika Łódzka
    Data:
    konferencja 25-28 czerwca 2013
    Status:
    Published