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Information on the principal investigator and host institution

Information of the project and the call

Keywords

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Quantitative analysis of first atomic layers by surface sensitive electron spectroscopies

2011/01/B/ST4/00959

Keywords:

Electron transport theory electron scattering by surfaces determination of surface composition

Descriptors:

  • ST4_3: Molecular architecture and structure
  • ST4_8: Organic chemistry
  • ST4_5: Analytical chemistry

Panel:

ST4 - Chemistry: physical chemistry/chemical physics, theoretical chemistry, analytical chemistry, inorganic chemistry, organic chemistry, method development

Host institution :

INSTYTUT CHEMII FIZYCZNEJ PAN

woj. mazowieckie

Other projects carried out by the institution 

Principal investigator (from the host institution):

prof. Aleksander Jabłoński 

Number of co-investigators in the project: 6

Call: OPUS 1 - announced on 2011-03-15

Amount awarded: 666 820 PLN

Project start date (Y-m-d): 2011-12-01

Project end date (Y-m-d): 2014-11-30

Project duration:: 36 months (the same as in the proposal)

Project status: Project settled

Equipment purchased [PL]

  1. Pompa bezolejowa XDS10 (15 500 PLN)
  2. Anoda cyrkonowo-magnezowa, Zr/Mg (19 300 PLN)
  3. Linia dozowania gazów z zaworami (7 000 PLN)
  4. Oprogramowanie NAG Fortran.
  5. Komputer z drukarką (25 000 PLN)
  6. Oprogramowanie (Acrobat, Borland C++ XE2, Lahey Fortran, NAG Fortran, MS Office Pro) (5 szt.) (10 000 PLN)

Information in the final report

  • Publication in academic press/journals (17)
  • Book publications / chapters in book publications (3)
  1. Cross sections for inner-shell ionization by electron impact
    Authors:
    X. Llovet, C. J. Powell, F. Salvat, A. Jablonski
    Academic press:
    Journal of Physical and Chemical Reference Data (rok: 2014, tom: 43, strony: 13102), Wydawca: AIP Publishing
    Status:
    Published
    DOI:
    10.1063/1.4832851 - link to the publication
  2. XPS study of arsenic doped ZnO grown by Atomic Layer Deposition
    Authors:
    D. Snigurenko, R. Jakiela, E. Guziewicz, E. Przezdziecka, M. Stachowicz, K. Kopalko, A. Barcz, W. Lisowski, J.W. Sobczak, M. Krawczyk, A. Jabłoński
    Academic press:
    Journal of Alloys and Compounds (rok: 2014, tom: 582, strony: 594-597), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.jallcom.2013.08.061 - link to the publication
  3. Emission depth distribution function for photoelectrons emitted by laboratory hard X-ray sources
    Authors:
    A. Jabłoński
    Academic press:
    Journal of Electron Spectroscopy and Related Phenomena (rok: 2014, tom: 195, strony: 26-42), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.elspec.2014.04.012 - link to the publication
  4. Angular distribution of elastic electron backscattering from surfaces: determination of the electron inelastic mean free path
    Authors:
    A. Jabłoński
    Academic press:
    Journal of Physics D: Applied Physics (rok: 2014, tom: 47, strony: 55301), Wydawca: IOP Publishing
    Status:
    Published
    DOI:
    10.1088/0022-3727/47/5/055301 - link to the publication
  5. Atomic layer deposition of Zn_1-xMg_xO: Al transpoarent conducting films
    Authors:
    G. Luka, B.S. Witkowski, L. Wachnicki, K. Goscinski, R. Jakiela, E. Guziewicz, M. Godlewski, E. Zielony, P. Bieganski, E. Placzek-Popko, W. Lisowski, J.W. Sobczak, A. Jablonski
    Academic press:
    Journal of Materials Science (rok: 2014, tom: 49, strony: 1512-1518), Wydawca: Springer
    Status:
    Published
    DOI:
    10.1007/s10853-013-7832-5 - link to the publication
  6. Elastic-peak electron spectroscopy (EPES) studies of ZnO single crystals
    Authors:
    M. Krawczyk, W. Lisowski, J.W. Sobczak, A. Kosiński, A. Jabłoński
    Academic press:
    Journal of Alloys and Compounds (rok: 2014, tom: 590, strony: 553-556), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.jallcom.2013.12.140 - link to the publication
  7. Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast
    Authors:
    A. Sulyok, A. L. Toth, L. Zommer, M. Menyhard, A. Jablonski
    Academic press:
    Ultramicroscopy (rok: 2013, tom: 124, strony: 88-95), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.ultramic.2012.08.004 - link to the publication
  8. Studies of the Hot-pressed TiN Material by Electron Spectroscopies
    Authors:
    M. Krawczyk, W. Lisowski, J. W. Sobczak, A. Kosiński and A. Jablonski
    Academic press:
    Journal of Alloys and Compounds (rok: 2013, tom: 546, strony: 280-285), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.jallcom.2012.08.089 - link to the publication
  9. Effective attenuation lengths for photoelectrons emitted by high-energy laboratory sources
    Authors:
    A. Jablonski, C. J. Powell
    Academic press:
    Journal of Electron Spectroscopy and Related Phenomena , Wydawca: Elsevier
    Status:
    Accepted for publication
    DOI:
    brak - link to the publication
  10. ALD Grown Zinc Oxide with Controllable Electrical Properties
    Authors:
    E. Guziewicz, M. Godlewski, L. Wachnicki, T. A. Krajewski, G. Luka,S. Gieraltowska, R. Jakiela, A. Stonert, W. Lisowski, M. Krawczyk,J. W. Sobczak and A. Jablonski
    Academic press:
    Semiconductor Science and Technology (rok: 2012, tom: 27, strony: 74011), Wydawca: IOP Publishing
    Status:
    Published
    DOI:
    10.1088/0268-1242/27/7/074011 - link to the publication
  11. Angular distribution of photoelectrons emitted by the laboratory soft and hard X-ray radiation sources
    Authors:
    A. Jabłoński
    Academic press:
    Journal of Electron Spectroscopy and Related Phenomena (rok: 2013, tom: 189, strony: 81-95), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.elspec.2013.08.002 - link to the publication
  12. Elastic Photoelectron Scattering Effects in the XPS Analysis of Stratified Samples
    Authors:
    A. Jablonski
    Academic press:
    Journal of Physics D: Applied Physics (rok: 2012, tom: 45, strony: 315302), Wydawca: IOP Publishing
    Status:
    Published
    DOI:
    10.1088/0022-3727/45/31/315302 - link to the publication
  13. Improved algorithm for calculating the Chandrasekhar function
    Authors:
    A. Jablonski
    Academic press:
    Computer Physics Communications (rok: 2013, tom: 184, strony: 440-442), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.cpc.2012.08.020 - link to the publication
  14. Photoelectron emission from thin overlayers
    Authors:
    A. Jablonski
    Academic press:
    Journal of Electron Spectroscopy and Related Phenomena (rok: 2012, tom: 185, strony: 498-508), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.elspec.2012.09.014 - link to the publication
  15. Contribution of elastic photoelectron scattering to the shape of measured XPS intensity in-depth profile
    Authors:
    L. Zommer, W. Lisowski, A. Jablonski
    Academic press:
    Surface and Interface Science (rok: 2014, tom: 46, strony: 269-275), Wydawca: John Wiley
    Status:
    Published
    DOI:
    10.1002/sia.5409 - link to the publication
  16. XPS method as a useful tool for studies of quantum well epitaxial materials: Chemical composition and thermal stability of InGaN/GaN multilayers
    Authors:
    W. Lisowski, E. Grzanka, J. W. Sobczak, M. Krawczyk, A. Jabłoński, R. Czernecki, M. Leszczyński, T. Suski
    Academic press:
    Journal of Alloys and Compounds (rok: 2014, tom: 597, strony: 181-187), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.jallcom.2014.02.007 - link to the publication
  17. Photoelectron transport in the surface region of solids: Universal analytical formalism for quantitative applications of electron spectroscopies
    Authors:
    A. Jablonski
    Academic press:
    Journal of Physics D: Applied Physics , Wydawca: IOP Publishing
    Status:
    Accepted for publication
    DOI:
    brak - link to the publication
  1. Determination of the electron IMFP from Elastic Peak Electron Spectroscopy
    Authors:
    A. Jabłoński, M. Krawczyk
    Book:
    Determination of the electron IMFP from Elastic Peak Electron Spectroscopy (rok: 2014, tom: Podręcznik, strony: 18629), Wydawca: Instytut Chemii Fizycznej PAN
    Status:
    Submitted
    DOI:
    link to the publication
  2. Calculations of the surface composition using the XPS multiline analysis. User's guide
    Authors:
    A. Jabłoński, M. Krawczyk, W. Lisowski, J.W. Sobczak
    Book:
    Calculations of the surface composition using the XPS multiline analysis. User's guide (rok: 2013, tom: Podręcznik, strony: 35796), Wydawca: Instytut Chemii Fizycznej PAN
    Status:
    Submitted
  3. Overlayer Thickness Determination from the XPS Peak Intensities
    Authors:
    L. Zommer, A. Jabłoński
    Book:
    Overlayer Thickness Determination from the XPS Peak Intensities (rok: 2014, tom: Podręcznik, strony: 12420), Wydawca: Instytut Chemii Fizycznej PAN
    Status:
    Submitted

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