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  1. 1. Displacement metrology of nano-electro-mechanical systems (NEMS) based on scanning tunneling microscopy methods

    Principal investigator: Michał Łukasz Babij

    Politechnika Wrocławska, Wydział Elektroniki Mikrosystemów i Fotoniki

    Call: PRELUDIUM 11, Panel: ST7

Graphic design and implementation: Jakub Piotrowski