Projects funded by the NCN
Nanometrology of field emission phenomena from electron beam deposited nanowires operating as nano- and picodeflection sensors – FEmet
2022/45/N/ST7/03049
Keywords:
scanning electron microscopy focused ion beam focused electron beam induced deposition focused ion beam induced deposition field emission microelectromechanical systems nanoelectronics
Descriptors:
- ST7_004:
Panel:
ST7 - Systems and communication engineering: electronics, communication, optoelectronics
Host institution :
Politechnika Wrocławska
woj. dolnośląskie
Principal investigator (from the host institution):
Number of co-investigators in the project: 2
Call: PRELUDIUM 21 - announced on 2022-03-28
Amount awarded: 139 812 PLN
Project start date (Y-m-d): 2023-03-01
Project end date (Y-m-d): 2025-02-28
Project duration:: 24 months (the same as in the proposal)
Project status: Project completed
Project description
Download the project description in a pdf file
Note - project descriptions were prepared by the authors of the applications themselves and placed in the system in an unchanged form.
Information in the final report
- Publication in academic press/journals (2)
- Fabrication of focused ion beam-deposited nanowire probes for conductive atomic force microscopyAuthors:Ewelina Gacka, Bartosz Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo W. Rangelow, Teodor GotszalkAcademic press:Measurement (rok: 2024, tom: 234, strony: 46029), Wydawca: ElsevierStatus:PublishedDOI:10.1016/j.measurement.2024.114815 - link to the publication
- New design of operational MEMS bridges for measurements of properties of FEBID-based nanostructuresAuthors:Bartosz Pruchnik, Krzysztof Kwoka, Ewelina Gacka, Dominik Badura, Piotr Kunicki, Andrzej Sierakowski, Paweł Janus, Tomasz Piasecki, Teodor GotszalkAcademic press:The Beilstein Journal of Nanotechnology (rok: 2024, tom: 15, strony: 1273 - 1282), Wydawca: BeilsteinStatus:PublishedDOI:10.3762/bjnano.15.103 - link to the publication