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Information on the principal investigator and host institution

Information of the project and the call

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Optical, structural and electronic properties of III-V quantum dots on silicon

2019/33/B/ST5/02941

Keywords:

quantum dot III-V semiconductors optical spectroscopy structural properties band structure

Descriptors:

  • ST5_001:
  • ST5_013:
  • ST3_004:

Panel:

ST5 - Materials: materials synthesis, structure-properties relations, advanced and functional materials with designed properties, (macro)molecular architecture, material engineering

Host institution :

Politechnika Wrocławska

woj. dolnośląskie

Other projects carried out by the institution 

Principal investigator (from the host institution):

prof. Grzegorz Sęk 

Number of co-investigators in the project: 9

Call: OPUS 17 - announced on 2019-03-15

Amount awarded: 1 483 800 PLN

Project start date (Y-m-d): 2020-05-19

Project end date (Y-m-d): 2024-05-18

Project duration:: 48 months (the same as in the proposal)

Project status: Project settled

Project description

Download the project description in a pdf file

Note - project descriptions were prepared by the authors of the applications themselves and placed in the system in an unchanged form.

Information in the final report

  • Publication in academic press/journals (6)
  1. Xenon plasma-focused ion beam milling for fabrication of high-purity, bright single-photon sources operating in the C-band
    Authors:
    M. Jaworski, P. Mrowiński, M. G. Mikulicz, P. Holewa, L. Zeidler, M. Syperek, E. Semenova, G. Sęk
    Academic press:
    Optics Express (rok: 2024, tom: 32, strony: 41089-41101), Wydawca: Optica Publishing Group
    Status:
    Published
    DOI:
    10.1364/OE.534313 - link to the publication
  2. Fast and efficient approach for multi-component quantum wells analysis based on FFT
    Authors:
    L. Pawlaczyk, D. Pucicki, J. Serafinczuk
    Academic press:
    Measurement (rok: 2021, tom: 186, strony: 110118-1-8), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2021.110118 - link to the publication
  3. High-resolution X-ray diffraction to probe quantum dot asymmetry
    Authors:
    J. Serafińczuk, W. Rudno-Rudziński, M. Gawełczyk, P. Podemski, K. Parzyszek, A. Piejko, V. Sichkovskyi, J.P. Reithmaier, G. Sęk
    Academic press:
    Measurement (rok: 2023, tom: 221, strony: 113451-1-9), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2023.113451 - link to the publication
  4. Monolithic Integration of Sub-50 nm III–V Nano-Heterostructures on Si (001) for Telecom Photonics
    Authors:
    A. Nanwani, P. Wyborski, M. S. Seifner, S. Kadkhodazadeh, G. Sęk, K. Yvind, P. Holewa, E. Semenova
    Academic press:
    Advanced Optical Materials (rok: 2025, tom: nie dotyczy, strony: 2403419-1-9), Wydawca: Wiley Advanced
    Status:
    Published
    DOI:
    10.1002/adom.202403419 - link to the publication
  5. X-ray diffraction studies of residual strain in AlN/sapphire templates
    Authors:
    J. Serafinczuk, L. Pawlaczyk, K. Moszak, D. Pucicki, R. Kudrawiec, D. Hommel
    Academic press:
    Measurement (rok: 2022, tom: 200, strony: 111611-1-7), Wydawca: Elsevier
    Status:
    Published
    DOI:
    10.1016/j.measurement.2022.111611 - link to the publication
  6. Effects of dislocation filtering layers on optical properties of third telecom window emitting InAs/InGaAlAs quantum dots grown on silicon substrates
    Authors:
    W. Rudno-Rudziński, M. Gawełczyk, P. Podemski, E. Cybula, S. Gorantla, R. Balasubramanian, V. Sichkovskyi, A. J. Willinger, G. Eisenstein, J. P. Reithmaier. G. Sęk
    Academic press:
    ACS Applied Materials & Interfaces (rok: 2024, tom: 16, strony: 51150-51162), Wydawca: American Chemical Society
    Status:
    Published
    DOI:
    10.1021/acsami.4c12061 - link to the publication

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